On defects, they've proven within the micron scale that they add no new defects towards the layer transferred towards the SmartSiC, nonetheless potential operate to extend that to the entire wafer would supply certainty on the macro pattern. The chance for unbiased validation of these substrates would allay any remaining https://www.facebook.com/permalink.php?story_fbid=pfbid0VCARyNTxLQN8hADkVfrhkW4wGZovySkKkrVrvNWaDKt4A6wDueGSLFr7dSah3zWDl&id=61560512640678&__cft__[0]=AZX1XKgfkza3ybh0dgXN7DIN3AQ1zHwKM2J5m0GuBCiUlnDa9UAYG5n-yrsmrB-WRPkyvTmpnErYcGlcQK89f27L0DrSRF3_XV7Eybw7oOHAmohQFFOxB32l79W6GsjjUjSD4m6vEHEkDy-rgpBasq-Rue_QQKaXnivpkwo-kb_YC1oCIdS0gSZ2yfJrmQezs7GsMc1TIFAZ2oGbW-IsnTOm&__tn__=%2CO%2CP-R